Design With Sub-10 Nm Finfet Technologies

2017 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC)(2017)

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摘要
• The close interaction of the process capabilities requires that the circuit and physical design architecture be comprehended — This is classical Design Technology Co-optimization (DTCO) • Only increasing over time • Memory transistor design must anticipate the required — Read and write assists • And their impact on area • Denser cell libraries restrict the possible cells — Smaller libraries are an inevitable result • Complex cells with breaks are better assembled by the APR tool • Flexible sizing and placement with multiple cells • At all points in the design process the anticipated physical design has to be understood — The lines/cuts metallization is an example of these requirements • APR tools must calculate the parasitics of moving cuts and the extra dummy metals as the design is routed to avoid large critical path impact
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关键词
FinFET technology,circuit design architecture,physical design architecture,design technology co-optimization,DTCO,memory transistor design,read assists,write assists,denser cell libraries,complex cells,APR tool,flexible sizing,flexible placement,lines-cuts metallization,extra dummy metals,size 10 nm
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