Application of Dual-target Computed Tomography for Material Decomposition of Low-Z Materials

The extension of conventional computed tomography known as spectral computed tomography involves utilizing the variations in X-ray attenuation, driven by spectral and material dependencies. This technique enables the virtual decomposition of scanned objects, revealing their elemental constituents. The resultant images provide quantitative information, such as material concentration within the scanned volume. Enhancements in results are achievable through methods that capitalize on the strong correlation among decomposed images, effectively minimizing noise and artifacts. The Rigaku nano3DX submicron tomograph uses a dual-target source, which allows the generation of two distinct X-ray spectra through different target materials. This configuration holds promise for high-resolution applications in spectral tomography, particularly for low-Z materials, where it offers high contrast in the acquired images. The potential of this setup in the context of spectral computed tomography is explored in this contribution, delving into its applications for materials characterized by low atomic numbers.