Quantification of the strong, phonon-induced Urbach tails in e̱ṯa̱-Ga2O3 and their implications on electrical breakdown
arxiv(2024)
摘要
In ultrawide bandgap (UWBG) nitride and oxide semiconductors, increased
bandgap (Eg) correlates with greater ionicity and strong electron-phonon
coupling. This limits mobility through polar optical phonon scattering,
localizes carriers via polarons and self-trapping, broadens optical transitions
via dynamic disorder, and modifies the breakdown field. Herein, we use
polarized optical transmission spectroscopy from 77-633 K to investigate the
Urbach energy (Eu) for many orientations of Fe- and Sn-doped e̱ṯa̱-Ga2O3 bulk
crystals. We find Eu values ranging from 60-140 meV at 293 K and static
(structural defects plus zero-point phonons) disorder contributes more to Eu
than dynamic (finite temperature phonon-induced) disorder. This is evidenced by
lack of systematic Eu anisotropy, and Eu correlating more with X-ray
diffraction rocking-curve broadening than with Sn-doping. The lowest measured
Eu are 10x larger than for traditional semiconductors, pointing out that band
tail effects need to be carefully considered in these materials for high field
electronics. We demonstrate that, because optical transmission through thick
samples is sensitive to sub-gap absorption, the commonly-used Tauc extraction
of bandgap from transmission through Ga2O3 greater than 1-3 micro meter thick
is subject to errors. Combining our Eu(T) from Fe-doped samples with Eg(T) from
ellipsometry, we extract a measure of an effective electron-phonon coupling
indicating increases in weighted 2nd order deformation potential with
temperature and a larger value for E parallel b than E parallel c. The large
electron-phonon coupling in beta-Ga2O3 suggests that theories of electrical
breakdown for traditional semiconductors need expansion to account not just for
lower scattering time but also for impact ionization thresholds fluctuating in
both time and space.
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