Mixed phase measurement during icing process utilizing multi-wavelength interdigital sensor

In order to solve the problem of measuring dynamic icing processes in natural and industrial scenarios, a multiwavelength interdigital sensor is proposed and evaluated. The sensor is capable of measuring the icing ratio and calculating the water film and ice thickness in real time during the dynamic process. A temperature-drift selfcompensation model based on the principle of relaxation polarization and the calculation method of icing ratio is established, and finite element simulations of the static ice layer and the dynamic icing process are carried out. The distortion of the complex capacitance curves caused by temperature drift and ice-water mixed phase in the dynamic process is analyzed, and the eigenvectors based on three penetration depths are introduced. The experimental results show that the root mean square error (RMSE) of the ice temperature measured based on the relaxation time is 1.13 degrees C, which reduces the RMSE of the static ice thickness measurement to 0.24 mm. In the dynamic process, the RMSE of the icing ratio measurement for the full cycle of the water film icing process is 0.078, and the RMSE of the thickness prediction reaches 0.20 mm.