UTEMS: A Unit Testing Scheme for Event-driven Microservices

Shang-Pin Ma, Yu-Yung Yang,Shin-Jie Lee, Hang-Wei Yeh

2023 10th International Conference on Dependable Systems and Their Applications (DSA)(2023)

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摘要
This paper introduces a novel scheme to facilitate unit testing for event-driven microservices. The proposed approach includes implementation procedures formulated in accordance with the message broker, event publishing and consumption, and individual steps in the saga design pattern. The proposed approach makes it possible to formulate unit test cases that effectively capture errors associated with publishing, the channel subscription process, invalid message formatting, and ineffective error remediation methods.
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关键词
event-driven microservice,unit testing,saga,Apache Kafka
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