Nanoscale Thermal Transport in Vertical Gate-All-Around Junctionless Nanowire Transistors--- Part II: Multiphysics Simulation

H. Rezgui,C. Mukherjee,Y. Wang, M. Deng,A. Kumar, J. Muller,G. Larrieu,C. Maneux

IEEE TRANSACTIONS ON ELECTRON DEVICES(2023)

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摘要
Today, extensive research has focused on heat propagation in emerging nanoelectronic devices. With advances in the fabrication of nanowire (NW) transistors, thermal management has become a critical issue in cooling strategies and conducting materials. In this article, we present a novel multiphysics analysis of the nanoscale thermal transport in 18-nm vertical junctionless gate-all-around (GAA) silicon NW transistors. Based on this multiphysics analysis, we developed a new computational model derived from the Guyer-Krumhansl equation (GKE) for describing heat transport within the nanoscale device. Our simulations results agree well with available theoretical approaches as well as measurement data.
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关键词
Guyer–Krumhansl equation (GKE),heat dissipation,junctionless nanowire transistors (JLNTs),nanoscale thermal transport,thermal resistance
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