Fault Recovery from Multi-Tenant FPGA Voltage Attacks

GLSVLSI '23: Proceedings of the Great Lakes Symposium on VLSI 2023(2023)

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摘要
As multi-tenant FPGA applications continue to scale in size and complexity, their need for resilience against environmental effects and malicious actions continues to grow. To ensure continuously correct computation, faults in the compute fabric must be identified, isolated, and suppressed in the nanosecond to microsecond range. In this paper, we detail a circuit and system-level methodology to detect compute failure conditions due to on-FPGA voltage attacks. Our approach rapidly suppresses incorrect results and regenerates potentially-tainted results before they propagate, allowing time for an attacker to be suppressed. Instrumentation includes voltage sensors to detect error conditions induced by attackers. This analysis is paired with focused remediation approaches involving data buffering, fault suppression, results recalculation, and computation restart. Our approach has been demonstrated using an RSA encryption circuit implemented on a Stratix 10 FPGA. We show that a voltage attack using on-FPGA power wasters can be effectively detected and computation halted in 15 ns, preventing the injection of timing faults. Potentially tainted results are successfully regenerated, allowing for fault-free circuit operation. A full characterization of the latency and resource overheads of fault detection and recovery is provided.
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关键词
Hardware Security, Fault Detection and Recovery, On-chip Voltage Sensor
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