Functional Criticality Analysis of Structural Faults in AI Accelerators

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems(2022)

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摘要
The ubiquitous application of deep neural networks (DNNs) has led to a rise in demand for artificial intelligence (AI) accelerators. For example, the tensor processing unit from Google-based on a systolic array-and its variants are of considerable interest for DNN inferencing using AI accelerators. This article studies the problem of classifying structural faults in such an accelerator based on their functional criticality. We first analyze pin-level faults in the processing elements (PEs) of a systolic array. Simulation results for the LeNet network with 8-bit fixed-point, 16-bit floating-point (FP), and 32-bit FP data paths applied to the MNIST dataset show that over 93% of the pin-level structural faults in a PE are functionally benign. We present a greedy iterative framework for determining the criticality of stuck-at faults in a PE netlist and analyze the limitations of criticality analysis methods based on repeated fault simulations. We next present a scalable two-tier machine-learning (ML)-based method to assess the functional criticality of stuck-at faults in a computationally efficient manner. We address the problem of minimizing misclassification by utilizing generative adversarial networks (GANs). Two-tier ML/GAN-based criticality assessment leads to less than 1% test escapes during functional criticality evaluation of structural faults.
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关键词
Artificial intelligence (AI) accelerator,binary classification,catastrophic faults,deep learning,defect screening,functional criticality,generative adversarial network (GAN),greedy fault-dropping,stuck-at faults,systolic array,test escape,two-tier framework
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