SAPIENS: A 64-kb RRAM-Based Non-Volatile Associative Memory for One-Shot Learning and Inference at the Edge

IEEE TRANSACTIONS ON ELECTRON DEVICES(2021)

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摘要
Learning from a few examples (one/few-shot learning) on the fly is a key challenge for on-device machine intelligence. We present the first chip-level demonstration of one-shot learning with Stanford Associative memory for Programmable, Integrated Edge iNtelligence via life-long learning and Search (SAPIENS), a resistive random access memory (RRAM)-based non-volatile associative memory (AM) chip that serves as the backend for memory-augmented neural networks (MANNs). The 64-kb fully integrated RRAM-CMOS AM chip performs long-term feature embedding and retrieval, demonstrated on a 32-way one-shot learning task on the Omniglot dataset. Using only one example per class for 32 unseen classes during on-chip learning, SAPIENS achieves 79% measured inference accuracy on Omniglot, comparable to edge software model accuracy using five-level quantization (82%). It achieves an energy efficiency of 118 GOPS/W at 200 MHz for in-memory L1 distance computation and prediction. Multi-bank measurements on the same chip show that increasing the capacity from three banks (24 kb) to eight banks (64 kb) improves the chip accuracy from 73.5% to 79%, while minimizing the accuracy excursion due to bank-to-bank variability.
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关键词
Feature extraction, Computer architecture, Sensors, Microprocessors, Voltage measurement, Programming, Resistance, Associative memory (AM), memory-augmented neural networks (MANNs), one-shot learning, resistive random access memory (RRAM, ReRAM)
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