Non-Destructive Defect Level Analysis Of Graphene Using Amplitude-Modulated Discharge Current Analysis

The intrinsic characteristics of novel devices and materials are often misunderstood due to the characterization methods which are developed to analyze existing devices or materials. Even though graphene is a very well-known material, there hasn't been a proper method to assess the density and energy levels of defects in graphene non-destructively, especially after the device fabrication. Here, we report a new non-destructive defect analysis method, amplitude-modulated discharge current analysis (AMDCA). The validity of this method was confirmed using a graphene field effect transistor with physically predefined defect densities in the channel. Charge trap densities (N-ct) of the order of similar to 10(12) cm(-2) were observed at the defect level in the range of 0.15-0.29 eV. This method can be very useful for the in-depth study of graphene devices as well as other two-dimensional materials that don't have a body contact. (C) 2021 Published by Elsevier Ltd.