Innovative Multilayer OTS Selectors for Performance Tuning and Improved Reliability

2020 IEEE International Memory Workshop (IMW)(2020)

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摘要
In this paper, we investigate an innovative Ovonic Threshold Switching Selector (OTS) based on Multilayer structure (ML). Thanks to physico-chemical analysis and electrical characterization we show how MLs properties and structure can be tuned thanks to the engineering of each individual layer stoichiometry, thickness and interfaces. Ge/N-doped SbSe-based MLs OTS are analyzed by FTIR and Raman spectroscopy revealing the structural features present in the as-deposited materials and the strong interaction among individual layers at interfaces. We demonstrate the improved variability control of electrical parameters wrt standard OTS achieved by co-sputtering technique, and the high endurance capability of MLs OTS up to more than 2•10 9 cycles with stable nA leakage current. Moreover, we show how Ge-N bonds play a huge role on OTS thermal stability at 400°C and how they can be tuned more easily in ML OTS. These developments pave the way towards a new class of OTS materials and their engineering, ensuring high temperature stability and best tuning of electrical performances.
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关键词
thermal stability,leakage current,variability control,Raman spectroscopy,FTIR,innovative multilayer OTS selectors,innovative ovonic threshold switching selector,improved variability control,as-deposited materials,structural features,individual layer stoichiometry,electrical characterization,physico-chemical analysis,multilayer structure,electrical performances,OTS materials,ML OTS,Ge-N bonds,electrical parameters,temperature 400.0 degC,Ge-N,SbSe
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