Current-controlled negative differential resistance in small-polaron hopping system

Current-controlled negative differential resistance (CC-NDR) phenomenon attracts a lot of interest for fabricating the access devices of nonvolatile memory based on crossbar array architectures. However, simple, bipolar, two-terminal commercial devices that exhibit CC-NDR are currently lacking because a number of critical characteristics needed to be met for such application. Here, we report the CC-NDR observed in Mn1.56Co0.96Ni0.48O4 (MCNO)-a small-polaron hopping material. Our experimental data and simulation reveal that the CC-NDR arises from self-heating effect due to the nature of strong electron-phonon coupling in small-polaron hopping system. The reported CC-NDR exhibits adjustable threshold voltage from 10(-3) to 10(2) V, on-state current from 10(5) to 10(8) A/cm(2) and off-state current is as low as similar to 10 A/cm(2) depending on device dimensions, thermal isolation condition, environmental temperature and activation energy of material. Uniquely, unlike in NbO2, Nb2O5, TiO2, TaOx et. al. materials, the CC-NDR in MCNO is more stable and reliable, because it does not undergo any electroforming process. These traits make MCNO a very potential candidate for CC-NDR devices. (c) 2019 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).