Thermoelectric properties of Quantum Dot-based devices

2018 IEEE 18TH INTERNATIONAL CONFERENCE ON NANOTECHNOLOGY (IEEE-NANO)(2018)

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摘要
By means of advanced numerical simulation, the thermoelectric properties of a Si-quantum dot-based single-electron transistor working in sequential regime are investigated using our homemade simulator that self-consistently couples the 3D Poisson, Schrödinger and Master equations. At high voltage bias, the multi-level effects are shown to induce non-linear characteristics of the heat current. Additionally, the single-electron transistor operating in generator regime is shown to exhibit very good efficiency at maximum power.
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关键词
thermoelectric properties,quantum dot-based devices,advanced numerical simulation,Si-quantum dot-based single-electron transistor,sequential regime,homemade simulator,3D Poisson,Master equations,high voltage bias,multilevel effects,nonlinear characteristics,single-electron transistor operating,generator regime,Si
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