High Performance Mobile Soc Productization With Second-Generation 10-Nm Finfet Technology And Extension To 8-Nm Scaling

Jun Yuan,Ken Rim,Ying Chen,Ming Cai,Youseok Suh, Jihong Choi,Jie Deng,Jerry Bao,Zhimin Song,Lixin Ge,Hao Wang,Xiao-Yong Wang, Vicki Lin, Chihwei Kuo,Sam Yang, Ashwin Rabindranath, Shrihari Siva,Prasad Bhadri,Sungwon Kim,Kwon Lee, Soon Cho, Sunggun Kang, Saechoon Oh,S. D. Kwon,Xiangdong Chen, Paul Penzes, Parag Agashe, William Miller, P. R. Chidambaram

2018 IEEE SYMPOSIUM ON VLSI TECHNOLOGY(2018)

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摘要
We report on Snapdragon T SDM845 mobile SoC in mass production with a second-generation 10-nm finFET technology. SDM845 exhibits 30-40% CPU/GPU performance gain over SDM835 (first-generation 10-nm finFET process) together with similar to 10% battery life increase driven by new design features and technology improvements in both transistor performance and uniformity, enabling high performance and low power solution for both mobile and computing/AI applications. Extending the technology scaling further, similar to 15% logic circuit area scaling over 10 nm has been realized in an 8-nm node with gate and BEOL pitch scaling enabled by quadruple patterning (LE<^> 4). Yield equivalence to 10 nm has been demonstrated in 8-nm IP chips.
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关键词
yield equivalence,quadruple patterning,BEOL pitch scaling,logic circuit area scaling,low power solution,design features,battery life,mass production,CPU-GPU performance gain,second-generation FinFET technology,Snapdragon SDM845 mobile SoC,first-generation finFET process,IP chips,transistor performance,technology improvements,SDM835,high performance mobile SoC productization,size 10.0 nm,size 8 nm
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