Fast rise time IR detectors for lepton colliders

Diagnostics is a fundamental issue for accelerators whose demands are continuously increasing. In particular bunch-by-bunch diagnostics is a key challenge for the latest generation of lepton colliders and storage rings. The Frascati Phi-factory, DA Phi NE, colliding at 1.02 GeV in the centre of mass, hosts in the main rings few synchrotron radiation beamlines and two of them collect the synchrotron radiation infrared emission: SINBAD from the electron ring and 3+L from the positron ring. At DA Phi NE each bucket is 2.7 ns long and particles are gathered in bunches emitting pulsed IR radiation, whose intensity in the long wavelength regime is directly proportional to the accumulated particles. Compact uncooled photoconductive HgCdTe detectors have been tested in both beamlines using dedicated optical layouts. Actually, the fast rise time of HgCdTe semiconductors give us the chance to test bunch-by-bunch devices for both longitudinal and transverse diagnostics. For the longitudinal case, single pixel detectors have been used, while for the transverse diagnostics, multi-pixel array detectors, with special custom design, are under test. This contribution will briefly describe the status of the research on fast IR detectors at DA Phi NE, the results obtained and possible foreseen developments.