First Foundry Platform Of Complementary Tunnel-Fets In Cmos Baseline Technology For Ultralow-Power Iot Applications: Manufacturability, Variability And Technology Roadmap

2015 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM)(2015)

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摘要
We have first manufactured Complementary Tunnel-FETs (C-TFETs) in standard 12-inch CMOS foundry. With abrupt tunnel junction consideration for improved TFET performance, technology of monolithically integrating C-TFET with CMOS is developed. Planar Si C-TFET inverter is also demonstrated, indicating a new electrical isolation requirement between neighboring devices for practical C-TFET integration on bulk substrate. For high-volume production, the variability of C-TFETs are experimentally investigated, demonstrating an intrinsic trade-off between performance enhancement and variability suppression induced by dominant variation source in traditional TFETs, which is mainly impacted by the band-to-band tunneling generation area. By new TFET device design, improved performance and variability simultaneously are experimentally achieved, and circuit-level implementation shows significant operation speed enhancement (up to 93%) and energy reduction (by 66%) at V-DD of 0.4V, as well as remarkably suppressed variation, indicating its great potential for ultralow-power applications.
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关键词
complementary tunnel-FET,CMOS baseline technology,ultralow-power IoT application,tunnel junction,TFET performance improvement,monolithically integrating C-TFET technology,planar silicon C-TFET inverter,electrical isolation requirement,high-volume production,performance enhancement,variability suppression,band-to-band tunneling generation,TFET device design,circuit-level implementation,energy reduction,ultralow-power applications,Internet of Things,size 12 inch
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