Advances In Unit Testing: Theory And Practice

2016 IEEE/ACM 38th International Conference on Software Engineering Companion (ICSE-C)(2016)

引用 22|浏览82
暂无评分
摘要
Parameterized unit testing, recent advances in unit testing, is a new methodology extending the previous industry practice based on traditional unit tests without parameters. A parameterized unit test (PUT) is simply a test method that takes parameters, calls the code under test, and states assertions. Parameterized unit testing allows the separation of two testing concerns or tasks: the specification of external, black-box behavior (i.e., assertions or specifications) by developers and the generation and selection of internal, white box test inputs (i.e., high-code-covering test inputs) by tools. PUTs have been supported by various testing frameworks. Various open source and industrial testing tools also exist to generate test inputs for PUTs. This technical briefing presents latest research on principles and techniques, as well as practical considerations to apply parameterized unit testing on real-world programs, highlighting success stories, research and education achievements, and future research directions in developer testing.
更多
查看译文
关键词
Parameterized Unit Testing,Test Generation,Test Oracles
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要