Voltage droop reduction using throttling controlled by timing margin feedback

VLSIC(2012)

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摘要
An active processor throttling control loop using critical path timing measurements is enabled in the shipping POWER7™ based P775 supercomputer to prevent voltage droop induced failures. As a result, worst-case workload-induced voltage droop events are reduced by more than 50% compared to the system operating without the control loop. The reduction in operating voltage afforded by this technique translates to significant yield improvement, reduced failure rates, and improved power efficiency.
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关键词
VLSI,failure analysis,integrated circuit reliability,mainframes,power integrated circuits,VLSI,active processor throttling control loop,critical path timing measurements,power efficiency,shipping POWER7 based P775 supercomputer,timing margin feedback,voltage droop induced failures,voltage droop reduction,worst-case workload-induced voltage droop events,VLSI,critical path,reliability,voltage droop,
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