A design method for minimum cost path of flying probe in-circuit testers

Hiratsuka, Y., Katoh, F.,Konishi, K., Seiichi Shin

Taipei（2010）

引用 24|浏览2

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摘要

This paper focuses on X-Y type in-circuit testers, which has two flying probes. The problem of finding the ordering of inspection points that minimizes the total time of inspection is an expansion of the travelling salesman problem (TSP). We formulate the problem of finding the minimum traveling cost of flying probes as the 0-1 integer programming, and an algorithm to solve this problem is proposed. Experimental results show the effectiveness of the method.

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关键词

inspection,integer programming,printed circuit testing,travelling salesman problems,0-1 integer programming,x-y type in-circuit tester,flying probe in-circuit tester,minimum cost path,travelling salesman problem,0–1 integer programming formatting,traveling salesman problem,printed circuits,testing,linear programming,design method,trajectory

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