High Performance Mixed Signal and RF Circuits Enabled by the Direct Monolithic Heterogeneous Integration of GaN HEMTs and Si CMOS on a Silicon Substrate

Compound Semiconductor Integrated Circuit Symposium(2011)

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摘要
In this work we present recent results on the direct heterogeneous integration of GaN HEMTs and Si CMOS on a silicon substrate. GaN HEMTs whose DC and RF performance are comparable to GaN HEMTs on SiC substrates have been achieved. As a demonstration vehicle we designed and fabricated a GaN amplifier with pMOS gate bias control circuitry (a current mirror) and heterogeneous interconnects. This simple demonstration circuit is a building block for more advanced RF, mixed signal and power conditioning circuits, such as reconfigurable or linearized PAs with in-situ adaptive bias control, high power digital-to-analog converters (DACs), driver stages for on-wafer optoelectronics, and on-chip power distribution networks.
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cmos integrated circuits,iii-v semiconductors,mmic amplifiers,elemental semiconductors,field effect mmic,gallium compounds,high electron mobility transistors,integrated circuit interconnections,microwave field effect transistors,mixed analogue-digital integrated circuits,silicon,wide band gap semiconductors,cmos process,gan,hemt,si,sic,amplifier,demonstration vehicle,direct monolithic heterogeneous integration,driver stages,frequency 10 ghz,heterogeneous interconnects,high performance mixed signal circuit,high power digital-to-analog converters,in-situ adaptive bias control,on-chip power distribution networks,on-wafer optoelectronics,pmos gate bias control circuitry,power conditioning circuits,silicon substrate,chip
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