Comparison of Direct Growth and Wafer Bonding for the Fabrication of GaInP/GaAs Dual-Junction Solar Cells on Silicon

Photovoltaics, IEEE Journal of  (2014)

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摘要
Two different process technologies were investigated for the fabrication of high-efficiency GaInP/GaAs dual-junction solar cells on silicon: direct epitaxial growth and layer transfer combined with semiconductor wafer bonding. The intention of this research is to combine the advantages of high efficiencies in III-V tandem solar cells with the low cost of silicon. Direct epitaxial growth of a GaInP/GaAs dual-junction solar cell on a GaAsyP1-y buffer on silicon yielded a 1-sun efficiency of 16.4% (AM1.5g). Threading dislocations that result from the 4% lattice grading are still the main limitation to the device performance. In contrast, similar devices fabricated by semiconductor wafer bonding on n-type inactive Si reached efficiencies of 26.0% (AM1.5g) for a 4-cm2 solar cell device.
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iii-v semiconductors,dislocations,gallium arsenide,gallium compounds,indium compounds,semiconductor epitaxial layers,semiconductor growth,solar cells,vapour phase epitaxial growth,wafer bonding,gainp-gaas,iii-v tandem solar cells,si,direct epitaxial growth,dual-junction solar cells,efficiency 16.4 percent,efficiency 26.0 percent,lattice grading,semiconductor wafer bonding,threading dislocations,heterojunctions,iii–v multijunction solar cells,silicon,photovoltaic systems,epitaxial growth
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