Nanoscale characterization of ferroelectric materials by scanning probe microscope under ultrahigh vacuum
Applications of Ferroelectrics, International Workshop Acoustic Transduction Materials and Devices & Workshop Piezoresponse Force Microscopy（2014）
摘要
The downsizing trend in multilayer ceramic capacitors (MLCCs) will reach a limit as long as a conventional way of materials development continues. Creation of advanced materials and precise control of materials properties will be a key technology to break through the current situation. To address this issue, scanning probe microscopy under ultrahigh vacuum (UHV-SPM) is employed to clarify materials properties from nanoscale perspective. Kelvin probe force microscopy allows us to obtain surface potential mapping on degraded dielectrics with highly spatial resolution, which is promising to consider degradation mechanism of MLCCs. Piezoresponse force microscopy enables not only to evaluate size dependent properties of ferroelectric nanoislands but also to investigate temperature dependence of domain images in Sn doped strontium titanate ceramics. Characterization of ferroelectrics based on UHV-SPM will open a new way to design future MLCCs.
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关键词
electric domains,ferroelectric ceramics,ferroelectricity,lead compounds,nanostructured materials,piezoceramics,piezoelectricity,scanning probe microscopy,strontium compounds,surface potential,tin compounds,kelvin probe force microscopy,pzt,srsntio3,degradation mechanism,degraded dielectrics,doped strontium titanate ceramics,ferroelectric materials,ferroelectric nanoislands,multilayer ceramic capacitors,piezoresponse force microscopy,size-dependent properties,spatial resolution,surface potential mapping,temperature-dependent domain images,ultrahigh vacuum,sn doped strontium titanate,multilayer ceramic camacitors,nanoisland,hysteresis,temperature measurement,dielectrics,force,tin,degradation,microscopy
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