Electronic Band Structures and Native Point Defects of Ultrafine ZnO Nanocrystals.

ACS applied materials & interfaces(2015)

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摘要
Ultrafine ZnO nanocrystals with a thickness down to 0.25 nm are grown by a metalorganic chemical vapor deposition method. Electronic band structures and native point defects of ZnO nanocrystals are studied by a combination of scanning tunneling microscopy/spectroscopy and first-principles density functional theory calculations. Below a critical thickness of about 1 nm ZnO adopts a graphitic-like structure and exhibits a wide band gap similar to its wurtzite counterpart. The hexagonal wurtzite structure, with a well-developed band gap evident from scanning tunneling spectroscopy, is established with a thickness starting from about 1.4 nm. With further increase of the thickness to 2 nm, VO-VZn defect pairs are easily produced in ZnO nanocrystals due to the self-compensation effect in highly doped semiconductors.
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关键词
SCANNING TUNNELING SPECTROSCOPY,QUANTUM DOTS,ZINC-OXIDE,MICROSCOPY,NANOWIRES,CLUSTERS,AU(111),GROWTH
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