Studies of the g factors and the hyperfine structure constants for the octahedral interstitial Mn2+ and Cr++ impurities in silicon

ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES(2013)

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摘要
The g factors and the hyperfine structure constants for the octahedral interstitial Mn2+ and Cr+ impurities in silicon are theoretically studied using the perturbation formulas of these parameters for an octahedral 3d(5) cluster. In the calculations, both the crystal-field and charge transfer contributions are taken into account in a uniform way, and the related molecular orbital coefficients are quantitatively determined from the cluster approach. The theoretical g factors and the hyperfine structure constants are in good agreement with the experimental data. The charge transfer contribution to the g-shift (approximate to g - g(s), where g(s) approximate to 2.0023 is the spin only value) is opposite (positive) in sign and about 51%-116% in magnitude as compared with the crystal-field one for Mn2+ and Cr+, respectively. Nevertheless, the charge transfer contribution to the hyperfine structure constant has the same sign and about 12%-19% that of the crystal-field one. Importance of the charge transfer contribution shows the order Cr+ < Mn2+ due to increase of the impurity valence state in the same host, especially for the g factor.
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关键词
Electron Paramagnetic Resonance,Defect and Impurities,Mn2+,Cr+,Silicon
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