Statistical timing analysis with two-sided constraints
ICCAD(2005)
摘要
Based on a timing yield model, a statistical static timing analysis technique is proposed. This technique preserves existing methodology by selecting a "device file setting" that takes into account within-die statistical variations, and with which to run traditional static timing analysis in order to meet the desired yield. Using process-specific "generic paths" representing critical paths in a given process technology, our approach can be used early in the design process, most importantly during the pre-placement phase. Within-die variations are taken care of using a simple model that assumes positive correlation, which leads to upper and lower bounds on the timing yield. Our approach also handles both setup and hold timing constraints.
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关键词
two-sided constraint,simple model,statistical timing analysis,design process,account within-die statistical variation,traditional static timing analysis,timing constraint,process technology,timing yield,timing yield model,statistical static timing analysis,within-die variation,integrated circuit design,static timing analysis,critical path,statistical analysis,upper and lower bounds
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