A 1.0-ns/1.0-V Delay-Locked Loop With Racing Mode and Countered CAS Latency Controller for DRAM Interfaces

J. Solid-State Circuits(2012)

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摘要
The digital delay-locked loop (DLL) with racing mode and the countered column address strobe (CAS) latency controller are proposed in this paper. The dual-DLL architecture with racing operation is adopted to achieve low power consumption, low jitter, fast locking, wide range of locking, and stuck-free control. The merged dual coarse delay line (MDCDL) reduces the dynamic power consumption of a variable delay line by 30% by sharing a part of the delay line path in DLL. In addition, jitter is reduced by 45 ps in the 1066-DDR3 operating mode by MDCDL. The proposed DLL utilizes an or-and functioned duty cycle corrector (or-and DCC), which consumes 15% of DLL's power, 0.915 pJ/Hz at tCK=1.5 ns and VDD=1.575 V. The countered CAS latency controller (CCLC) saves IDD3N current because it does not need a DLL clock and does not need to be activated for IDD3N (active non-power down) state. The DLL clock is enabled and CCLC is activated only when the read command is issued. This operation condition saves the IDD3N current by 60% with the proposed DLL. The proposed DLL is employed in 128 M×8 DDR3 SDRAM and 64 M×16 DDR3 SDRAM. The former and the latter are fabricated by 5×nm and by 4× nm DRAM process technology, respectively. Experimental results show that ±10% duty error of the external clock can be corrected to within ±2% duty error in less than 512 cycles of locking time under 1.5 ns of tCK. The proposed DLL and CCLC can operate above 1.0-GHz operating frequency at 1.2 V in 5× nm DDR3 SDRAM and at 1.0 V in 4× nm DDR3 SDRAM, respectively. The proposed DLL fabricated with 4× nm technology consumes 6.1 pJ/Hz at 1.575 V.
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关键词
delay locked loop,dram process technology,dll clock,voltage 1.575 v,column address strobe (cas) latency controller,voltage 1.2 v,ddr3,merged dual coarse delay line,column address strobe,drams,idd3n,low-power electronics,delay-locked loop (dll),racing mode,dram interfaces,dram chips,delay line path,ddr3 operating mode,mdcdl,clocks,stuck-free control,merged dual coarse delay line (mdcdl),countered cas latency controller,ddr3 sdram,or-and dcc,dual coarse delay line,dual-dll architecture,read command,oa-dcc,duty cycle corrector (dcc),frequency 1.0 ghz,delay lock loops,or-and functioned duty cycle corrector,voltage 1.0 v,idd3p,logic gates,low power electronics
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