Characterization of surface oxide layers formed on FeAl alloys by annealing under different atmospheres

SURFACE AND INTERFACE ANALYSIS(2008)

引用 14|浏览3
暂无评分
摘要
XPS and SIMS were used for characterizing the surface oxide layers formed on Fe - Al alloys during annealing under atmospheres with different partial pressures of oxygen, which were controlled by H2O/H-2 ratios in the gas. The XPS results showed that an aluminum oxide (Al2O3) layer was formed on the surfaces of samples annealed at a high temperature under a low partial pressure of oxygen, while such a layer was not formed on the surfaces of samples annealed under a high partial pressure of oxygen. SIMS depth profiles showed that the surfaces of samples annealed at high temperatures under a low partial pressure of oxygen were covered with a thin Al2O3 layer of approximately 50 nm thickness. It was also shown that oxygen penetrated the samples annealed under a high partial pressure of oxygen, and the depth profile of oxygen was correlated with that of aluminum. This indicates that internal oxidation of aluminum occurs in the samples annealed under a high partial pressure of oxygen. Grazing-incidence X-ray diffraction (GIXD) was also employed for analyzing the structure of the Al2O3 layer formed on the surface of samples annealed under a low partial pressure of oxygen. Copyright (c) 2008 John Wiley & Sons, Ltd.
更多
查看译文
关键词
iron-based alloy,aluminum oxide,X-ray photoelectron spectroscopy,secondary-ion mass spectrometry,depth profiling
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要