Low-Overhead Run-Time Memory Leak Detection and Recovery

Riverside, CA(2006)

引用 14|浏览2
暂无评分
摘要
Memory leaks are known to be a major cause of reliability and performance issues in software. This paper describes a run-time scheme that detects and removes memory leaks with minimal performance overhead and with no modifications to application source code. The scheme consists of a first stage where a pattern recognition technique proactively detects subtle memory leaks, followed by a more resource-intensive second stage that scans the memory space of an application and removes detected memory leaks. The pattern recognition technique in the first stage is based on the multivariate state estimation technique (MSET) which provides accurate detection of subtle memory leaks with very little overhead. The second stage is only activated when problems are identified by the first stage. For our prototype, this second stage is based on debugging and analysis tools provided by Solaris 10. Due to the low-overhead impact of the first stage, the system can be monitored for memory leaks without incurring noticeable performance degradation. We present and discuss some results from our unique proactive detection and debugging methodology
更多
查看译文
关键词
two-dimensional software reliability model,software-testing time,multivariate state estimation technique,pattern recognition,software reliability,storage management,calendar time,leak detection,software performance evaluation,estimation theory,two-time measure,time scale,system recovery,software architecture,run-time memory leak detection,test-execution time,low-overhead run-time memory,pattern recognition technique,memory leaks,source code
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要