A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation

Design & Test of Computers, IEEE(2004)

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摘要
Divide-and-conquer is a natural way to cope with the complexity of automatic testbench generation. The key to developing an effective divide-and-conquer approach is to identify the partitioning boundaries where interactions among divided components are minimized. The authors propose a novel design decomposition scheme and show how it can help improve the performance of constraint solving for test generation.
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novel design decomposition scheme,divide-and-conquer-based algorithm,effective divide-and-conquer approach,automatic simulation vector generation,test generation,divided component,partitioning boundary,automatic testbench generation,computational complexity,formal verification,simulation,divide and conquer,sat solver,satisfiability,state space,binary decision diagram,automatic test pattern generation,computability
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