Low-Cost and Highly Robust Quadruple Node Upset Tolerant Latch Design

Licai Hao, Yaling Wang,Yunlong Liu, Shiyu Zhao, Xinyi Zhang,Yang Li,Wenjuan Lu,Chunyu Peng,Qiang Zhao,Yongliang Zhou,Chenghu Dai,Zhiting Lin,Xiulong Wu

IEEE Transactions on Very Large Scale Integration (VLSI) Systems（2024）

引用 4|浏览21

关键词

Latches,Transistors,SRAM cells,Reliability,MOSFET,Reliability engineering,Ions,High robustness,low cost,polarity hardening technology,quadruple-node-upset (QNU),radiation hardening,source-isolation technology

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