Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell Through Quasi-Static Modeling
Micromachines（2024）
关键词
hot carriers,interface traps,electron trapping,slow traps,extended drain,MOSFETs source-drain resistance,mobility reduction,SPAD,smart power
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要