基本信息
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Bio
FLORIAN CACHO received the PhD degree in material science from Ecole des Mines de Paris, in 2005. In 2005 he joined STMicroelectronics (Crolles, France) as a Technology Computed Aided Design engineer in the Technology Modeling Department. From 2009 to 2018, he was in charge of Design-in-Reliability methodology and models at STMicroelectronics. Since 2018, he is Design to Product Reliability manager. As a senior member of the Technical Staff, he is working on device/circuit reliability modeling, design for reliability and product qualifications. He is author of several international papers related to reliability and modelling techniques, and serving as Chairman and reviewer in different conferences (IRPS, IOLTS…).
Research Interests
Papers共 130 篇Author StatisticsCo-AuthorSimilar Experts
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Micromachinesno. 2 (2024): 205-205
Pascal Chevalier,Florian Cacho,C. Durand,N. Derrier, V. Millon,Frederic Monsieur,A. Gauthier, P. Billy,Sébastien Fregonese,Thomas Zimmer,H. Audouin,Michel Buczko,Didier Céli,C. Deglise-Favre,Cheikh Diouf, O. Foissey,M. Hello,N. Guitard, S. Madassamy, S. Ramirez-Ruiz, C. Renard,F. Sonnerat, V. Yon,D. Gloria, G. Waltisperger
BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposiumpp.13-17, (2024)
IEEE Transactions on Device and Materials Reliabilityno. 3 (2024): 466-466
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
F. Cacho,P. Cathelin,J. Hai, S. Bouvot, J. Nowakowski, M. Martinez, R. Debroucke, S. Jean,R. Paulin,J. Antonijevic,X. Federspiel,N. Planes,G. Papotto,A. Parisi,A. Finocchiaro,A. Cavarra, A. Castorina,C. Nocera,G. Palmisano
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
2023 IEEE International Integrated Reliability Workshop (IIRW)pp.1-6, (2023)
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS (2023)
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Author Statistics
#Papers: 130
#Citation: 1036
H-Index: 20
G-Index: 25
Sociability: 6
Diversity: 2
Activity: 4
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