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Thermal Improvement of HBM with Joint Thermal Resistance Reduction for Scaling 12 Stacks and Beyond

2023 IEEE 73RD ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, ECTC(2023)

Cited 4|Views8
Key words
High bandwidth memory (HBM),Thermal characteristics,Stack thermal resistance,Thermocompression bonding,Hybrid copper bonding,multi-chip package
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