Highly Reliable and Secure PUF Using Resistive Memory Integrated into a 28 Nm CMOS Process
IEEE TRANSACTIONS ON ELECTRON DEVICES（2023）
Key words
Physical unclonable function,Voltage,Resistors,Programming,Nonvolatile memory,Transistors,Switches,Hardware security,physical unclonable functions (PUFs),resistive random access memory (ReRAM)
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined