HMM-Based Joint Modeling of Condition Monitoring Signals and Failure Event Data for Prognosis

Akash Deep,Shiyu Zhou, Dharmaraj Veeramani,Yong Chen

IEEE TRANSACTIONS ON RELIABILITY(2023)

引用 3|浏览5
暂无评分
摘要
Accurate estimation of remaining useful life (RUL) of a unit is critical to fulfill reliability commitments. In the presence of hard failures (i.e., absence of a predefined failure threshold), accurate prognosis of RUL using condition monitoring (CM) signals becomes challenging. To tackle this problem, we present a prognostic framework by jointly modeling CM signals and failure event data. Development of the presented method depends on the idea that while the unit operates, it continually degrades through a series of hidden states and the CM signals are functionally related to this hidden failure process. The unit fails once the hidden failure process reaches a dead state. Through this modeling, requirement of a failure threshold on CM signals is eliminated. We provide a modified expectation-maximization procedure to estimate parameters, and through a comprehensive set of numerical as well as real-world experiments, we demonstrate superior prognosis performance against some benchmark methods.
更多
查看译文
关键词
Hidden Markov models, Degradation, Modeling, Prognostics and health management, Hazards, Computational modeling, Biological system modeling, Condition monitoring (CM) signals, failure modeling, hard failures, hidden Markov model (HMM), remaining useful life (RUL)
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要