Precision Measurement of Compton Scattering in Silicon with a Skipper CCD for Dark Matter Detection
D. Norcini,N. Castello-Mor,D. Baxter, N. J. Corso,J. Cuevas-Zepeda,C. De Dominicis,A. Matalon,S. Munagavalasa,S. Paul,P. Privitera,K. Ramanathan,R. Smida,R. Thomas,R. Yajur,A. E. Chavarria,K. McGuire,P. Mitra,A. Piers,M. Settimo, J. Cortabitarte Gutierrez,J. Duarte-Campderros,A. Lantero-Barreda,A. Lopez-Virto,I. Vila,R. Vilar,N. Avalos,X. Bertou,A. Dastgheibi-Fard,O. Deligny,E. Estrada,N. Gadola,R. Gaior,T. Hossbach,L. Khalil,B. Kilminster,I. Lawson,S. Lee,A. Letessier-Selvon,P. Loaiza,G. Papadopoulos,P. Robmann,M. Traina,G. Warot,J-p. Zopounidis PHYSICAL REVIEW D（2022）
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