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Implementation of a 1GΩ Star-Mesh Graphene Quantized Hall Array Resistance Standard Network for High Resistance Calibration

Marta Musso, Wei-Chen Lin, Yanfei Yang,Ngoc Thanh Mai Tran, Alireza R. Panna, Cheng-Hsueh Yang,Randolph E. Elmquist,David B. Newell,Chi-Te Liang,Massimo Ortolano,Albert F. Rigosi, Dean G. Jarrett

IEEE Transactions on Instrumentation and Measurement(2025)

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Key words
Resistance,electrical resistance measurement,bridge circuits,calibration,graphene,Hall effect devices,standards
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