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A Low Overhead Single Event Transient Tolerant Bandgap Reference Based on Radiation-Hardened-by-Design (RHBD) Technique

Chunyu Peng, Neng Wan,Qiang Zhao, Chenghu Dai, Licai Hao,Zhiting Lin,Xiulong Wu

IEEE Transactions on Aerospace and Electronic Systems（2025）

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Key words
Bandgap reference,Radiation-hardened-by-design,Single event transient,low overhead
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