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An Edram Digital In-Memory Neural Network Accelerator for High-Throughput and Extended Data Retention Time

Inhwan Lee, Jehun Lee, Jaeyong Jang,Jae-Joon Kim

Design, Automation, and Test in Europe(2025)

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关键词
Chromatography,Neural Network,Data Retention,High Throughput,Cell Size,Memory Cells,Accuracy Loss,Logical Process,Longer Retention Time,Accuracy Of Neural Network,Digital Operations,Higher Frequency,Energy Efficiency,Convolutional Layers,Data Storage,Analog-to-digital Converter,Operating Frequency,Memory Capacity,Multiple Values,Storage Nodes,Capacitive Coupling,Hardware Implementation,Memory Operations,Increased Retention Time,Operation Speed,Output Node,Low Energy Efficiency,Short Retention Time
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