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Poster: Quantification of Feature-Interaction Masking in JHipster

Tim Jannik Schmidt, Sabrina Böhm,Sebastian Krieter,Thomas Thüm,Mathieu Acher

2025 IEEE Conference on Software Testing, Verification and Validation (ICST)(2025)

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关键词
Configurable Systems,Software Product Lines,Combinatorial Interaction Testing,Error Masking,Fault Masking
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