Experimental Study of Proton-Induced Radiation Effects on DDR5 Modules

Yang Li, Masakazu Yoshida, Yuibi Gomi, Yifan Deng,Yukinobu Watanabe,Satoshi Adachi,Masatoshi Itoh, Guohe Zhang,Chaohui He, Masanori Hashimoto

IEEE Transactions on Nuclear Science（2025）

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Key words

Proton,Single event effect (SEE),Soft error,Accumulated radiation effect,DRAM,DDR5,On-die ECC

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