Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current

Shijie Pan,Hui Zhu,Shiwei Feng, Yang, Chao Xu, Shuai Huo, Xiaozhuang Lu,Yamin Zhang, Kun Bai

IEEE Transactions on Instrumentation and Measurement（2025）

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关键词

Carbon nanotube field-effect transistor (CNTFET),energy level,transient drain current,trapping effect,time constant

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