Exploring Diffusion Model for Semiconductor Defect Detection

Kangkang Lu,Lile Cai,Xun Xu,Ramanpreet Singh Pahwa, Jie Wang,Richard Chang,Xulei Yang,Chuan-Sheng Foo

2024 IEEE 26th Electronics Packaging Technology Conference (EPTC)（2024）

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Key words

Diffusion Model,Deep Learning,Deep Models,X-ray Microscopy,Computer Vision Techniques,Deep Defects,Neural Network,Training Set,Receiver Operating Characteristic Curve,Learning Rate,Normal Samples,Gaussian Noise,Class Labels,Reversible Process,Real Samples,Natural Images,Small Amount Of Sample,Forward Process,Fluctuations In Performance

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