Mapping of a Quantitative Trait Locus for Stay-Green Trait in Common Wheat

Xin Li, Xin Bai, Lijuan Wu, Congya Wang, Xinghui Liu, Qiqi Li,Xiaojun Zhang,Fang Chen, Chengda Lu, Wei Gao,Tianling Cheng

Plants (Basel, Switzerland)（2025）

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Key words

wheat,stay green,flag leaf,chlorophyll content,QTL mapping

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