The Effect of Heavy-Ion Single Events on the Accuracy of SONOS Analog In-Memory Computing Accelerators
IEEE Transactions on Nuclear Science（2025）
关键词
Charge trap memory SONOS,flash memory,single event effects,single event upset,heavy ion irradiation,neural networks,analog accelerator
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要