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A Comparative Study of Supervised and Self-Supervised Denoising Techniques for Defect Segmentation in Industrial CT Imaging

Virginia Florian, Jiayang Shi, Willem Jan Palestijn,Daniël M. Pelt, K. Joost Batenburg,Thomas Lang, Christoph Heinzl,Christian Kretzer,Stefan Kasperl,Dominik Wolfschläger, Robert H. Schmitt

e-Journal of Nondestructive Testing（2025）

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