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In-situ Analog In-Memory Computing under Ionizing Radiation Exposure

T. Patrick Xiao,Maximilian Siath,Matthew Spear,Donald Wilson,Christopher H. Bennett,Ben Feinberg,David R. Hughart,Jereme Neuendank,William E. Brown,Hugh Barnaby,Vineet Agrawal,Helmut Puchner,Sapan Agarwal,Matthew J. Marinella

IEEE Transactions on Nuclear Science（2025）

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关键词
Ionizing radiation,in-memory computing,analog computing,total ionizing dose,SONOS,charge trap memory,flash memory,neural networks,machine learning
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