Robust Multi-Criteria Metal Artifact Reduction in Dual-Layer Cone-Beam CT J. D. O'Connell, M. W. Jacobson,M. Myronakis, D. M. Ferguson, Y. H. Hu,T. C. Harris,R. Fueglistaller, V. Birrer, R. Bruegger,M. Lehmann,P. Corral Arroyo,R. I. BerbecoMEDICAL PHYSICS(2024)引用 0|浏览1AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要