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Correlative Raman-Voltage Microscopy Revealing the Localized Structure-Stress Relationship in Silicon Solar Cells.

Tianyu Lan, Tianyi Zhao,Yan Liu, Jingyu Cao, Wenqi Li,Jie Yang,Xinyu Zhang,Yusheng Wang,Baoquan Sun

ACS NANO(2025)

Cited 0|Views11
Key words
solar cells,microcracks,localized stress,photovoltage and photocurrent,Raman microscopy
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