Prototype of Hi’Beam-SEE: A Real-time High-resolution Single Event Effects Locating Device for Heavy Ion Facilities
IEEE Transactions on Nuclear Science（2025）
关键词
Integrated circuits,neural network,readout electronics,single event effect,silicon pixel sensor
AI 理解论文
溯源树
样例
生成溯源树，研究论文发展脉络
Chat Paper
正在生成论文摘要